• altering the mechanical properties of sn films by alloying with bi: mimicking the effect of pb to suppress whiskers

    جزئیات بیشتر مقاله
    • تاریخ ارائه: 1392/07/24
    • تاریخ انتشار در تی پی بین: 1392/07/24
    • تعداد بازدید: 786
    • تعداد پرسش و پاسخ ها: 0
    • شماره تماس دبیرخانه رویداد: -
     stress is believed to be the main driving force for whisker formation in sn coatings on cu. this suggests that whiskering can be suppressed by enhancing stress relaxation in the sn layer, which is believed to be the reason why sn-pb alloys do not form whiskers. however, pb is no longer acceptable for use in electronics manufacturing. as an alternative, we used pulsed plating to create sn-bi coatings with an equiaxed microstructure similar to that of sn-pb alloys. an optical wafer curvature technique was used to measure stress relaxation kinetics in sn, sn-pb and sn-bi alloy thin films during thermal cycles. the results show that sn-bi films have significantly enhanced stress relaxation relative to pure sn films. comparison between sn-bi samples with equiaxed and columnar microstructures shows that both microstructure and alloy composition play a role in enhancing the stress relaxation.

سوال خود را در مورد این مقاله مطرح نمایید :

با انتخاب دکمه ثبت پرسش، موافقت خود را با قوانین انتشار محتوا در وبسایت تی پی بین اعلام می کنم
مقالات جدیدترین رویدادها
مقالات جدیدترین ژورنال ها