• fast identification of cracks using higher-order topological sensitivity for 2-d potential problems

    نویسندگان :
    جزئیات بیشتر مقاله
    • تاریخ ارائه: 1390/01/01
    • تاریخ انتشار در تی پی بین: 1390/01/01
    • تعداد بازدید: 429
    • تعداد پرسش و پاسخ ها: 0
    • شماره تماس دبیرخانه رویداد: -
     this article concerns an extension of the topological sensitivity (ts) concept for 2d potential problems involving insulated cracks, whereby a misfit functional j is expanded in powers of the characteristic size a of a crack. going beyond the standard ts, which evaluates (in the present context) the leading o(a2) approximation of j, the higher-order ts established here for a small crack of arbitrarily given location and shape embedded in a 2-d region of arbitrary shape and conductivity yields the o(a4) approximation of j. simpler and more explicit versions of this formulation are obtained for a centrally symmetric crack and a straight crack. a simple approximate global procedure for crack identification, based on minimizing the o(a4) expansion of j over a dense search grid, is proposed and demonstrated on a synthetic numerical example. bie formulations are prominently used in both the mathematical treatment leading to the o(a4) approximation of j and the subsequent numerical experiments.

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