• the effects of thermistor linearization techniques on the t-history characterization of phase change materials

    جزئیات بیشتر مقاله
    • تاریخ ارائه: 1392/01/01
    • تاریخ انتشار در تی پی بین: 1392/01/01
    • تعداد بازدید: 572
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     phase change materials (pcms) are increasingly being used in the area of energy sustainability. thermal characterization is a prerequisite for any reliable utilization of these materials. current characterization methods including the well-known t-history method depend on accurate temperature measurements. this paper investigates the impact of different thermistor linearization techniques on the temperature uncertainty in the t-history characterization of pcms. thermistor sensors and two linearization techniques were evaluated in terms of achievable temperature accuracy through consideration of both, non-linearity and self-heating errors. t-history measurements of rt21 (rubitherm® gmbh) pcm were performed. temperature measurement results on the rt21 sample suggest that the serial–parallel resistor (spr)1 linearization technique gives better uncertainty (less than ±0.1 °c) in comparison with the wheatstone bridge (wb)1 technique (up to ±1.5 °c). these results may considerably influence the usability of latent heat storage density of pcms in the certain temperature range. they could also provide a solid base for the development of a t-history measuring device.

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